For semiconductor manufacturers

With over twenty years of experience in yield management, Rudolph offers the yield analysis, data management, and defect classification solutions that have proven to be a critical part of controlling yield in the semiconductor and related industries.

In fact, Rudolph was first to market with "all-surface" defect analysis and is now installed in forty plus semiconductor, HDD, LED, solar, and flat panel companies worldwide.

Discover Enterprise

Seamless integration of yield and defect management software

Genesis Enterprise

Offline yield analysis package

Process Sentinel

Sort and defect spatial pattern recognition software

TrueADC Enterprise

High performance ADC

Yield Optimizer

Accurately Model Complex Processes to Improve Yield

Discover Review

A fast, intuitive, off-line, all-surface review and classification solution